XRD spectra and high-resolution TEM image. (a) XRD spectra of ITO NWs. (b) A high-resolution TEM image of ITO nanowire. The inset shows a corresponding selective area diffraction pattern, revealing that  is a preferred growth direction. (c) Chemical bonding information of In, Sn, and O for the ITO NWs extracted from the XPS spectra.
Chang et al. Nanoscale Research Letters 2012 7:684 doi:10.1186/1556-276X-7-684