Figure 1.

Variation of normalized resistance R(T)/R (30 K) with logarithm of temperature for the NW1 device. The insets show the resistance as a function of temperature between 1.7 and 300 K and an SEM image of the NW1 device taken from [22].

Lin et al. Nanoscale Research Letters 2012 7:673   doi:10.1186/1556-276X-7-673
Download authors' original image