|
Resolution: standard / high Figure 1.
Variation of normalized resistance R(T)/R (30 K) with logarithm of temperature for the NW1 device. The insets show the resistance as a function of temperature between 1.7 and 300 K
and an SEM image of the NW1 device taken from
[22].
Lin et al. Nanoscale Research Letters 2012 7:673 doi:10.1186/1556-276X-7-673 |