Figure 4.

Depth concentration profile of Pt for non-annealed and annealed samples measured by RBS. (A) Non-annealed PLLA samples deposited with Pt (5, 20, 30 and 50 nm). (B) PLLA samples subsequently annealed at 60°C.

Slepička et al. Nanoscale Research Letters 2012 7:671   doi:10.1186/1556-276X-7-671
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