Figure 4.

The LSP resonance effects and the determination of the average position of excitons in SiNx. (a) PL spectra for the samples with and without Ag nanostructures. PL enhancement factor (left axis) accompanied with the extinction spectra (right axis) for (b) Ag40 and (c) Ag80. (d) The Purcell factors vs. distance for Ag40 at λD = 750 nm and Ag80 at λD = 780 nm. The average position of excitons is located at 43 to 45 nm beneath the top surface of the SiNx films.

Wang et al. Nanoscale Research Letters 2012 7:669   doi:10.1186/1556-276X-7-669
Download authors' original image