Figure 2.

SKM, CAFM, and SCM images (left column) and 3D views (right column) of an original GeSi QR. (a) Height image measured simultaneously with the CPD image. (b) CPD image obtained at an AC modulation of 2 V and a lift height of 10 nm. (c) Current image measured at a sample bias of −1 V. (d) dC/dV amplitude image obtained by applying 2 V AC modulation to the sample. Each scale bar is 50 nm.

Lv et al. Nanoscale Research Letters 2012 7:659   doi:10.1186/1556-276X-7-659
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