Figure 3.

AFM images of Si(001)/8 nm MgO/15 nm Fe/1.8 nm MgO/2 nm CuPc films. (a) as grown, post-annealed at (b) 150°C and (c) 250°C.

Bae et al. Nanoscale Research Letters 2012 7:650   doi:10.1186/1556-276X-7-650
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