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Resolution: standard / high Figure 5.
Reflection measurement of the diffraction orders at λ = 632 nm from the single-layer grating. Inset shows the image of the reflected orders on a screen with the incident light
and 0th order passing through the same aperture.
Lai et al. Nanoscale Research Letters 2012 7:645 doi:10.1186/1556-276X-7-645 |