Figure 3.

A cross-sectional SEM image (beam voltage of 0.5 kV) of a double-layer PS film. The first high-porosity layer was etched by ICP-RIE followed by low porosity film growth after the etch.

Lai et al. Nanoscale Research Letters 2012 7:645   doi:10.1186/1556-276X-7-645
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