Figure 4.

Temperature dependence of sheet resistance of [Si/Sb80Te20]xfilms. (a). The crystallization temperature decreases with the increase of the periodic number. (b) Crystallization temperature as an exponential function of the total thickness of [Si/Sb80Te20]x films.

Zhu et al. Nanoscale Research Letters 2012 7:638   doi:10.1186/1556-276X-7-638
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