|
Resolution: standard / high Figure 4.
Temperature dependence of sheet resistance of [Si/Sb80Te20]xfilms. (a). The crystallization temperature decreases with the increase of the periodic number.
(b) Crystallization temperature as an exponential function of the total thickness of
[Si/Sb80Te20]x films.
Zhu et al. Nanoscale Research Letters 2012 7:638 doi:10.1186/1556-276X-7-638 |
