Effect of periodic number of [Si/Sb80Te20] x multilayer film on its laser-induced crystallization studied by coherent phonon spectroscopy
1 Department of Physics, School of Science, Guangdong University of Petrochemical Technology, Maoming, Guangdong, 525000, China
2 State-Key Laboratory of Optoelectronic Materials and Technologies, School of Physics and Engineering, Sun Yat-Sen University, Guangzhou, Guangdong, 510275, China
3 Functional Material Research Laboratory, Tongji University, Shanghai, 200092, China
4 Division of Energy and Environmental Research, Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai, 201210, China
Citation and License
Nanoscale Research Letters 2012, 7:638 doi:10.1186/1556-276X-7-638Published: 22 November 2012
The periodic number dependence of the femtosecond laser-induced crystallization threshold of [Si(5nm)/Sb80Te20(5nm)]x nanocomposite multilayer films has been investigated by coherent phonon spectroscopy. Coherent optical phonon spectra show that femtosecond laser-irradiated crystallization threshold of the multilayer films relies obviously on the periodic number of the multilayer films and decreases with the increasing periodic number. The mechanism of the periodic number dependence is also studied. Possible mechanisms of reflectivity and thermal conductivity losses as well as the effect of the glass substrate are ruled out, while the remaining superlattice structure effect is ascribed to be responsible for the periodic number dependence. The sheet resistance of multilayer films versus a lattice temperature is measured and shows a similar periodic number dependence with one of the laser irradiation crystallization power threshold. In addition, the periodic number dependence of the crystallization temperature can be fitted well with an experiential formula obtained by considering coupling exchange interactions between adjacent layers in a superlattice. Those results provide us with the evidence to support our viewpoint. Our results show that the periodic number of multilayer films may become another controllable parameter in the design and parameter optimization of multilayer phase change films.