Figure 1.

Cross-sectional HRTEM images of the Si-NCs embedded in a silicon carbide-based film. (a) Approximately 7-nm and (c) approximately 9-nm Si-NCs, enclosed by red circles for easy identification. (b) Selected area of the electron diffraction pattern from the portion indicated in (a). Presence of (0001)-oriented crystallites of the hexagonal silicon phase is confirmed.

Kim et al. Nanoscale Research Letters 2012 7:634   doi:10.1186/1556-276X-7-634
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