Tae-Youb Kim*, Chul Huh, Nae-Man Park, Cheol-Jong Choi and Maki Suemitsu*
* Corresponding authors: Tae-Youb Kim youby@etri.re.kr - Maki Suemitsu suemitsu@riec.tohoku.ac.jp
Nanoscale Research Letters 2012, 7:634 doi:10.1186/1556-276X-7-634