|
Resolution: standard / high Figure 2.
XRD pattern of GaAs NWs and the TEM images of the corresponding SAED pattern. (a) XRD pattern of GaAs NWs grown by 0.1-nm thick Au film on SiO2/Si substrates showing the wurtzite structure; (b) and (c) are the TEM images (scale bar = 50 nm) and the corresponding SAED pattern of one
typical NW showing the WZ phase and growth orientation of <11
 2>.
Han et al. Nanoscale Research Letters 2012 7:632 doi:10.1186/1556-276X-7-632 |
