Figure 1.

SEM and TEM images depict the surface morphology of GaAs NWs. (a) SEM image (scale bar = 2 μm) and magnified image in the inset (scale bar = 100 nm) and (b) TEM image (scale bar = 100 nm) of GaAs NWs grown by 0.1-nm thick Au film. (c) NW diameter distribution statistics performed in (b) is plotted after a measurement of approximately 100 NWs in TEM images.

Han et al. Nanoscale Research Letters 2012 7:632   doi:10.1186/1556-276X-7-632
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