Additional file 1.

Further details on material fabrication (Figure S1), the conductive AFM setup (Figure S2), AFM tip-sample interactions (S3), AFM height and friction images (Figure S4), and the correlation between SEM and C-AFM imaging (Figure S5) are given.

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Souier et al. Nanoscale Research Letters 2012 7:630   doi:10.1186/1556-276X-7-630