The CS-AFM images of the as-polished nanocomposite. (a) With Pt-coated tip and (b) with doped diamond-coated tip; (c) and (d) show the histograms of current extracted from the images (a) and (b), respectively. The histogram (c) is performed at various tip-sample forces in order to decouple the tip-sample contact resistance from the nanotube and composite resistance.
Souier et al. Nanoscale Research Letters 2012 7:630 doi:10.1186/1556-276X-7-630