SEM and XRD result of the ZnO/CdO core/shell nanorods grown on a Si substrate. (a) SEM image and (b) XRD pattern. The inset in (a) shows the top-view image with a scale bar of 1 μm. The peak labeled with asterisk is ascribed to the Al2O3 (1120) diffraction plane (JCPDS Cards no.: 43–1484).
Lee et al. Nanoscale Research Letters 2012 7:626 doi:10.1186/1556-276X-7-626