Figure 1.

Structure characterization and laser processing. (a) SEM images (the insert at the right top is a close-up), (b) TEM image, (c) TEM-EDX analysis, (d) TEM diffraction analysis of 3-D nanostructure formed around the laser irradiated spot during the femtosecond laser ablation of aluminosilicate ceramic at 11.0 W and 25.2 MHz, and (e) ablation process of aluminosilicate ceramic.

Sivayoganathan et al. Nanoscale Research Letters 2012 7:619   doi:10.1186/1556-276X-7-619
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