Figure 6.

The plain-view HRTEM images and histograms of the SiOxfilms. For samples with Tg at (a) 1,150°C, (b) 1,050°C, and (c) 900°C.

López et al. Nanoscale Research Letters 2012 7:604   doi:10.1186/1556-276X-7-604
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