Figure 3.

Cross-sectional TEM image of the organic–inorganic film on aluminum. To distinguish the fabricated thin film and SiO2 substrate clearly, an aluminum layer was deposited on the SiO2 substrate. The film fabricated on the aluminum layer clearly reveals a triple-layer structure.

Jitsui and Ohtani Nanoscale Research Letters 2012 7:591   doi:10.1186/1556-276X-7-591
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