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Transmission electron microscope observation of organic–inorganic hybrid thin active layers of light-emitting diodes

Yusuke Jitsui and Naoki Ohtani*

Author Affiliations

Department of Electronics, Doshisha University, 3-1 Tatara-Miyakodani, Kyotanabe-shi, Kyoto, 610-0321, Japan

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Nanoscale Research Letters 2012, 7:591  doi:10.1186/1556-276X-7-591

Published: 25 October 2012


We performed transmission electron microscope (TEM) observation of organic–inorganic hybrid thin films fabricated by the sol–gel reaction and used as the active layers of organic light-emitting diodes. The cross-sectional TEM images show that the films consist of a triple-layer structure. To evaluate the composition of these layers, the distribution of atoms in them was measured by energy-dispersive X-ray fluorescence spectroscopy. As a result, most of the organic emissive material, poly(9,9-dioctyl-fluorene-co-N-4-butylphenyl-diphenylamine (TFB), was found to be distributed in the middle layer sandwiched by SiO and SiO2 layers. The surface SiO layer was fabricated due to the lack of oxygen. This means that the best sol–gel condition was changed due to the TFB doping; thus, the novel best condition should be found.

Organic light-emitting diodes; TEM; sol–gel; Hybrid thin films; EDS