Figure 4.

STM micrograph of Ta layer and polar plot. (a) STM micrograph of a 6-nm-thick obliquely deposited (54°) Ta layer and (b) a polar plot of the transmitted intensity of a polarised laser beam through different directions of the 6-nm-thick obliquely deposited (54°) Ta film, which reveals the anisotropy in the optical properties of the sample.

Vergara et al. Nanoscale Research Letters 2012 7:577   doi:10.1186/1556-276X-7-577
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