Figure 3.

ZnO seed layer template, AuNP growth, and MIS memory device. XRD spectra of the (a) sputtered ZnO seed layer template annealed at various temperatures. (b) Corresponding AuNP growth using the ZnO seed template annealed at various temperatures. (c) Cross-sectional view of the MIS memory device for the sample annealed at 400°C.

Goh et al. Nanoscale Research Letters 2012 7:563   doi:10.1186/1556-276X-7-563
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