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Resolution: standard / high Figure 1.
SEM images of silicon MP/NW structure. (a) Plane-view and (b) cross-sectional SEM images of silicon MP/NW structure obtained from the etching
of silicon in the solution containing 4.6 M HF, 0.02 M AgNO3, and 0.05 M KMnO4 for 45 min.
Bai et al. Nanoscale Research Letters 2012 7:557 doi:10.1186/1556-276X-7-557 |
