Table 1 |
|||
| Summary of measured sheet resistances from different post treatments for SWNT films of varied metallic/semiconducting content | |||
| 5% M-SWNT (95% S-SWNT) (%) | 50% M-SWNT (50% S-SWNT) (%) | 90% M-SWNT (10% S-SWNT) (%) | |
| After annealing | +17.5 | −27.5 | −65.2 |
| After acid treatment | −96.64 | −51.3 | −15.0 |
| Combined effect | −76.3(Rs↓) | −78.8(Rs↓) | −80.2(Rs↓) |
Tey et al. Nanoscale Research Letters 2012 7:548 doi:10.1186/1556-276X-7-548