Figure 4.

Rough estimation for contact resistance (R_c) at the electrode-SWNTs interface. The ΔR_ii (values reported in Table 1) is the result of R_c, R_intratube, and R_cnt-cnt changes upon annealing. With additional annealing step (case (i)) carried out before electrode deposition, lesser resistance reduction was observed (ΔR_i <ΔR_ii). This resistance change (ΔR_i) is deduced to be the R_c contribution from the metal electrode.