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Resolution: standard / high Figure 5.
Selected area diffraction pattern of silicon nano-crystals grown at (a) 850°C and
at (b) 950°C. Diffraction rings are observed in both images. Their positions correspond to the
lattice spacing of <111> and <220> planes which are indicated in the figure.
Saxena et al. Nanoscale Research Letters 2012 7:547 doi:10.1186/1556-276X-7-547 |