Selected area diffraction pattern of silicon nano-crystals grown at (a) 850°C and at (b) 950°C. Diffraction rings are observed in both images. Their positions correspond to the lattice spacing of <111> and <220> planes which are indicated in the figure.
Saxena et al. Nanoscale Research Letters 2012 7:547 doi:10.1186/1556-276X-7-547