|
Resolution: standard / high Figure 7.
Resonant frequency measured on common and PS substrates. Variation of the inductance value (L12) with frequency for a W50N35R30 inductor integrated on various substrates. Except
for highly doped silicon substrates, fr between 6 and 7 GHz are obtained.
Capelle et al. Nanoscale Research Letters 2012 7:523 doi:10.1186/1556-276X-7-523 |
