Figure 4 .

FE-TEM micrograph and lattice planes. (a) FE-TEM micrograph. Lower inset, grain size distribution; upper inset, selective area electron diffraction pattern. (b) Lattice planes. Inset, lattice plane spacing for the composition x = 0.05.

Batoo et al. Nanoscale Research Letters 2012 7:511   doi:10.1186/1556-276X-7-511
Download authors' original image