Wei-Che Hsu, Chao-Chun Chen, Yong-Han Lin*, Huang-Kai Lin, Hsin-Tien Chiu and Juhn-Jong Lin*
* Corresponding authors: Yong-Han Lin yonghanlin@gmail.com - Juhn-Jong Lin jjlin@mail.nctu.edu.tw
Nanoscale Research Letters 2012, 7:500 doi:10.1186/1556-276X-7-500