Table 2 |
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| The formulas of major scattering mechanisms used in 2DEG mobility calculations | ||
| Scattering mechanism | Formula | Definition of variables |
| Acoustic phonon: piezoelectric [15-17] | ![]() |
K, electromagnetic coupling coefficient; JPE(k), electron wave vector dependent integral. |
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| Acoustic phonon: deformation [11,18] potential | ![]() |
ρ, crystal density; vs, longitudinal acoustic phonon velocity; Ξ, deformation potential constant; m*, electron effective mass; JDP(k), electron wave vector dependent integral. b, Fang-Howard expression; qs, reciprocal screening length; f(0), occupation probability; F11(q), ground-state Fang-Howard wave function. |
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| Polar optical phonon [17-19] | ![]() |
, polar optical phonon energy;
and
, high- and low-frequency dielectric constant; Z0, effective width of triangular well formed at the GaxIn1-xN/GaN interface and is given in terms of Fermi wave vector. |
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| Interface roughness [11,15,20] | ![]() |
Δ, lateral size of the roughness; Λ, correlation length between fluctuations; JIFR(k), correlation length and the lateral size-dependent integral; n2D, 2D electron density. |
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| Alloy disorder [20] | ![]() |
x, Ga fraction; Ω0, the volume occupied by one atom; UA, alloy potential. |
| Dislocation [21-23] | ![]() |
NDis, dislocation density per unit area which is taken as a fitting parameter; λD, Debye screening length; c, lattice constant of GaxIn1-xN. f, the fraction of filled traps that are assumed fully occupied. |
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Donmez et al. Nanoscale Research Letters 2012 7:490 doi:10.1186/1556-276X-7-490