Figure 2.

XEDS analysis. (a) A [<a onClick="popup('http://www.nanoscalereslett.com/content/7/1/486/mathml/M3','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/7/1/486/mathml/M3">View MathML</a>] cross-sectional TEM image of a relaxed InAs island. Straight lines ABCD and EFG indicate the positions from which XEDS data were obtained; (b) XEDS data detected along the line ABCD; (c) XEDS data detected along the line EFG.

Chen et al. Nanoscale Research Letters 2012 7:486   doi:10.1186/1556-276X-7-486
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