|
Resolution: standard / high Figure 2.
XEDS analysis. (a) A [
 ] cross-sectional TEM image of a relaxed InAs island. Straight lines ABCD and EFG
indicate the positions from which XEDS data were obtained; (b) XEDS data detected along the line ABCD; (c) XEDS data detected along the line EFG.
Chen et al. Nanoscale Research Letters 2012 7:486 doi:10.1186/1556-276X-7-486 |
