Figure 1.

Sketch of the structure used to model the ellipsometric data. Left: schematic drawing of the NAA structure showing the pores, the alumina, and the aluminum substrate. Right: the corresponding layered optical model considered by the characterization software. P is the porosity of the NAA, which corresponds to the volume fraction of air. The plus sign represents the use of a Bruggeman effective medium approximation to model the refractive index of the mixture of materials in the layer.

Rahman et al. Nanoscale Research Letters 2012 7:474   doi:10.1186/1556-276X-7-474
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