Figure 2.

XRC and Phi-scan patterns in XRD of InN films and InN nanorods. (a) FWHM values of high-resolution X-ray diffraction InN(0002) ω-rocking curves of InN films/nanorods and (b) InN(1012) phi-scan of InN films/nanorods.

Chen et al. Nanoscale Research Letters 2012 7:468   doi:10.1186/1556-276X-7-468
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