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Resolution: standard / high Figure 1.
Typical electron microscopic image of the PbTe anodized sample cross-section. Scanning electron microscopy image of a cross-section of the PbTe porous layer on
CaF2/Si(111) substrate fabricated using anodic electrochemical treatment with jа = 2 mA·cm−2 and tа = 10 min (sample tilt is 70°) [6].
Zimin et al. Nanoscale Research Letters 2012 7:442 doi:10.1186/1556-276X-7-442 |
