Figure 1 .

SEM images of Ag-nNDLs at × 50,000 (A) and × 150,000 (B). Topographical AFM images of Ag films: (C) smooth Ag substrate and (D) rough Ag-nNDLs. Insets show the depth profiles along each line.

Ahmed et al. Nanoscale Research Letters 2012 7:438   doi:10.1186/1556-276X-7-438
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