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Resolution: standard / high Figure 2 .
Cross-sectional SEM images of a sample with the diffusion n-Si mask. (а) Upon anodization and (b) upon dissolution of porous silicon. Rectangular area at the upper right side of
(b) corresponds to the magnified image in (a).
Astrova and Zharova Nanoscale Research Letters 2012 7:421 doi:10.1186/1556-276X-7-421 |