|
Resolution: standard / high Figure 6.
AFM images of InP surface with Pt NPs after 4 h of EPD. Left side: the sample was measured before annealing; right side: the sample was measured
after 160°C annealing in vacuum.
Zdansky Nanoscale Research Letters 2012 7:415 doi:10.1186/1556-276X-7-415 |
