Figure 3 .

Cross-section and plane view SEM images. Micrographs (a), (b) and (c) are cross-section views of the samples with resistivities of 5 × 10−3, 4 and 15 Ω·cm, respectively. Micrographs (d), (e) and (f) are plane views of the samples with resistivities of 5 × 10−3, 4, and 15 Ω·cm, respectively.

Kim and Cho Nanoscale Research Letters 2012 7:408   doi:10.1186/1556-276X-7-408
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