Figure 2 .

Contact angle measurement results. The images in (a), (b), (c) and (d) were obtained when a drop of etchant with surfactant (IPA) ratios of 0 %, 5 %, 33 % and 66 % were placed on the surface of the Si wafers, respectively.

Kim and Cho Nanoscale Research Letters 2012 7:408   doi:10.1186/1556-276X-7-408
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