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Resolution: standard / high Figure 2.
AFM image and topography plot of the nanostructure of the Si/PS micropatterns. ( a) 10 × 10 μm2 AFM image from a Si/PS boundary and (b) plot of the topographic profile from the diagonal line in (a).
Punzón-Quijorna et al. Nanoscale Research Letters 2012 7:396 doi:10.1186/1556-276X-7-396 |
