Study of the omnidirectional photonic bandgap for dielectric mirrors based on porous silicon: effect of optical and physical thickness
1 Department of Physics, Facultad de Ciencias, UAEM, Av., Universidad 1001 Col. Chamilpa, Cuernavaca, 62210, Morelos, Mexico
2 CIICAp, UAEM, Av., Universidad 1001 Col. Chamilpa, Cuernavaca, 62210, Morelos, Mexico
Nanoscale Research Letters 2012, 7:391 doi:10.1186/1556-276X-7-391Published: 13 July 2012
We report the theoretical comparison of the omnidirectional photonic bandgap (OPBG) of one-dimensional dielectric photonic structures, using three different refractive index profiles: sinusoidal, Gaussian, and Bragg. For different values of physical thickness (PT) and optical thickness (OT), the tunability of the OPBG of each profile is shown to depend on the maximum/minimum refractive indices. With an increase in the value of the maximum refractive index, the structures with the same PT showed a linear increment of the OPBG, in contrast to the structures with the same OT, showing an optimal combination of refractive indices for each structure to generate the maximum OPBG. An experimental verification was carried out with a multilayered dielectric porous silicon structure for all the three profiles.