Figure 5.

Precise adjustment of the channel wavelength positions of the fabricated device to the originally designed. Transmission spectra of the originally designed triple-defect device operating within the second SB ( m = 2, Table 1) (black line) and of the fabricated device with structural deviations of ± δ dSi= 20 nm = 5.6% ( m = 2, Table 2) (red line). (a) The refractive index of all cavities <a onClick="popup('http://www.nanoscalereslett.com/content/7/1/387/mathml/M37','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/7/1/387/mathml/M37">View MathML</a>. (b) Precise adjustment of the edge channel wavelength positions of the fabricated device to match those in the original design by decreasing the refractive index to <a onClick="popup('http://www.nanoscalereslett.com/content/7/1/387/mathml/M38','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/7/1/387/mathml/M38">View MathML</a>. (c) Final adjustment of the central channel with <a onClick="popup('http://www.nanoscalereslett.com/content/7/1/387/mathml/M39','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/7/1/387/mathml/M39">View MathML</a> and <a onClick="popup('http://www.nanoscalereslett.com/content/7/1/387/mathml/M40','MathML',630,470);return false;" target="_blank" href="http://www.nanoscalereslett.com/content/7/1/387/mathml/M40">View MathML</a>.

Baldycheva et al. Nanoscale Research Letters 2012 7:387   doi:10.1186/1556-276X-7-387
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