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Resolution: standard / high Figure 5.
Precise adjustment of the channel wavelength positions of the fabricated device to
the originally designed. Transmission spectra of the originally designed triple-defect device operating within
the second SB ( m = 2, Table 1) (black line) and of the fabricated device with structural deviations of ± δ dSi = 20 nm = 5.6% ( m = 2, Table 2) (red line). (a) The refractive index of all cavities
. (b) Precise adjustment of the edge channel wavelength positions of the fabricated device
to match those in the original design by decreasing the refractive index to . (c) Final adjustment of the central channel with and .
Baldycheva et al. Nanoscale Research Letters 2012 7:387 doi:10.1186/1556-276X-7-387 |