|
Resolution: standard / high Figure 7.
Whole device under the test.
Aliev et al. Nanoscale Research Letters 2012 7:378 doi:10.1186/1556-276X-7-378 |
|
Resolution: standard / high Figure 7.
Whole device under the test.
Aliev et al. Nanoscale Research Letters 2012 7:378 doi:10.1186/1556-276X-7-378 |
