Figure 7.

Intensity of fluorescence emission at 745 nm. Intensity of fluorescence emission, at 745 nm, of the cross-section of the samples analyzed at different distances to the crystalline Si-PSi interface. Pore size is 60 nm.

Hernandez et al. Nanoscale Research Letters 2012 7:364   doi:10.1186/1556-276X-7-364
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