TEM image, electron diffraction pattern, height-position information, and schematic plot. (a) High-magnification bright-field TEM image revealing the dendritic ZnO structure. Many short branches extending from the side of the main arm can be observed. (b) Electron diffraction pattern of the selected area of the sample, revealing the [0 0 1] zone axis of the ZnO nanowires. (c) to (d) The resulting height-position information for two selected perpendicular section lines taken from HRTEM images of a high-magnification enlargement of the selected region marked in Figure 2a. (e) Schematic plot of a single dendritic ZnO nanowire structure.
Shih et al. Nanoscale Research Letters 2012 7:354 doi:10.1186/1556-276X-7-354