|
Resolution: standard / high Figure 3.
The STEM image of the distribution and the EDX line scan. (a) STEM image of the distribution of components at the center and edge positions of
GeSi islands, (b) EDX line scan taken along the indicated lines shown in the STEM image. EDX data
were acquired along the lines near the center (red line) and edge (blue line) of the
islands.
Tang et al. Nanoscale Research Letters 2012 7:346 doi:10.1186/1556-276X-7-346 |
